发明申请
US20080298262A1 Broadband Test Line Access Circuit, Broadband Test-Line Access Board And Broadband Test Device
失效
宽带测试线路接入电路,宽带测试线接入板和宽带测试设备
- 专利标题: Broadband Test Line Access Circuit, Broadband Test-Line Access Board And Broadband Test Device
- 专利标题(中): 宽带测试线路接入电路,宽带测试线接入板和宽带测试设备
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申请号: US11570998申请日: 2005-07-20
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公开(公告)号: US20080298262A1公开(公告)日: 2008-12-04
- 发明人: Tao Yang , Jun Zhou , Zhiguo Yan , Ruijie Xiao
- 申请人: Tao Yang , Jun Zhou , Zhiguo Yan , Ruijie Xiao
- 申请人地址: CN GD Shenzhen
- 专利权人: HUAWEI TECHNOLOGIES CO., LTD.
- 当前专利权人: HUAWEI TECHNOLOGIES CO., LTD.
- 当前专利权人地址: CN GD Shenzhen
- 优先权: CN200410054821.X 20040722
- 国际申请: PCT/CN2005/001078 WO 20050720
- 主分类号: G06F11/00
- IPC分类号: G06F11/00
摘要:
A broadband test line-access unit, including a first test terminal, a second test terminal, a third test terminal, a signal splitter, a first switch, a second switch, a third switch, a first interface terminal, a second interface terminal and a third interface terminal. A broadband test line-access board, including at least two broadband test line-access units, a set of internal test buses, a fourth switch, a fifth switch and a sixth switch, the set of internal test buses including an internal inner-test bus, an internal outer-test bus and an internal auxiliary-test bus. A broadband test device, including at least one broadband test line-access boards, an eighth switch, a ninth switch, a test control module. The broadband test device is of simple structure and low cost, facilitates a port level N+1 backup function within a board, and thus can provide improved communication reliability.
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