发明申请
US20080281541A1 System and method for estimating reliability of components for testing and quality optimization
审中-公开
用于估计组件可靠性的系统和方法，用于测试和质量优化
- 专利标题： System and method for estimating reliability of components for testing and quality optimization
- 专利标题（中）： 用于估计组件可靠性的系统和方法，用于测试和质量优化
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申请号： US12080159申请日： 2008-03-31
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公开(公告)号： US20080281541A1公开(公告)日： 2008-11-13
- 发明人: Adit D. Singh , Thomas S. Barnett
- 申请人： Adit D. Singh , Thomas S. Barnett
- 主分类号： G06F19/00
- IPC分类号： G06F19/00
摘要：
A system and method for determining the early life reliability of an electronic component, including classifying the electronic component based on an initial determination of a number of fatal defects, and estimating a probability of latent defects present in the electronic component based on that classification with the aim of optimizing test costs and product quality.
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