发明申请
US20080176047A1 Liquid Composition for Immersion Lithography and Lithography Method Using the Same
审中-公开
用于浸没光刻的液体组合物和使用其的平版印刷方法
- 专利标题: Liquid Composition for Immersion Lithography and Lithography Method Using the Same
- 专利标题(中): 用于浸没光刻的液体组合物和使用其的平版印刷方法
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申请号: US11767275申请日: 2007-06-22
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公开(公告)号: US20080176047A1公开(公告)日: 2008-07-24
- 发明人: Keun Kyu Kong , Hyoung Ryeun Kim , Hyeong Soo Kim , Jae Chang Jung , Sung Koo Lee
- 申请人: Keun Kyu Kong , Hyoung Ryeun Kim , Hyeong Soo Kim , Jae Chang Jung , Sung Koo Lee
- 申请人地址: KR Kyungki-do
- 专利权人: HYNIX SEMICONDUCTOR INC.
- 当前专利权人: HYNIX SEMICONDUCTOR INC.
- 当前专利权人地址: KR Kyungki-do
- 优先权: KRKR10-2004-0036609 20040522; KRKR10-2004-0051501 20040702; KRKR10-2004-0051502 20040702; KRKR10-2004-0051503 20040702
- 主分类号: G03C1/73
- IPC分类号: G03C1/73 ; B41M5/00 ; G03F7/26 ; G03B27/42
摘要:
Disclosed herein are a liquid composition for immersion lithography and a lithography method using the composition. The liquid composition includes at least one nonionic surfactant selected from the group comprising of a polyvinyl alcohol, a pentaerythritol-based compound, a polymer containing an alkylene oxide, and a compound represented by Formula I: wherein R is a linear or branched, substituted C1-C40 alkyl, and n is an integer ranging from 10 to 10,000. The surface tension of the liquid composition is reduced by the nonionic surfactant, thereby solving the problem that the liquid composition is not completely filled or is partially concentrated on a wafer having a fine topology and removing micro bubbles between the photoresist film and the liquid composition.
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