Invention Application
- Patent Title: Temperature Control Device and Temparature Control Method
- Patent Title (中): 温度控制装置和温度控制方法
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Application No.: US10568623Application Date: 2004-08-18
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Publication No.: US20080164899A1Publication Date: 2008-07-10
- Inventor: Masakazu Ando , Hiroyuki Takahashi , Tsuyoshi Yamashita , Takashi Hashimoto
- Applicant: Masakazu Ando , Hiroyuki Takahashi , Tsuyoshi Yamashita , Takashi Hashimoto
- Priority: JP2003-294615 20030818
- International Application: PCT/JP04/11843 WO 20040818
- Main IPC: G01R31/26
- IPC: G01R31/26

Abstract:
Pressing an electronic device (2) to be tested to contact terminals (132a and 132b) while bringing a heater (112) having equal or close temperature change characteristics to those of the electronic device to be tested by a test pattern, transmitting a test pattern to the electronic device to be tested in this state, and controlling a power consumption of a heater so that total power of a power consumption of the electronic device to be tested by the test pattern and a power consumption of the heater becomes a constant value.
Public/Granted literature
- US07619427B2 Temperature control device and temperature control method Public/Granted day:2009-11-17
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