发明申请
US20080100689A1 Method for manufacturing an analytical test strip with an electroluminescent component
审中-公开
用于制造具有电致发光元件的分析测试条的方法
- 专利标题: Method for manufacturing an analytical test strip with an electroluminescent component
- 专利标题(中): 用于制造具有电致发光元件的分析测试条的方法
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申请号: US11591366申请日: 2006-10-31
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公开(公告)号: US20080100689A1公开(公告)日: 2008-05-01
- 发明人: Selwayan Saini , Marco Fabio Cardosi , Leanne Mills , Stephen Patrick Blythe
- 申请人: Selwayan Saini , Marco Fabio Cardosi , Leanne Mills , Stephen Patrick Blythe
- 主分类号: B41J2/435
- IPC分类号: B41J2/435
摘要:
A method for manufacturing an analytical test strip with an electroluminescent component (either an electroluminescent module and/or an electroluminescent lamp) includes sequentially applying to a substrate layer, a rear electrode layer disposed on the substrate layer, an electrically-insulating layer disposed over the rear electrode layer, a phosphor layer disposed over the electrically insulating layer, and a front electrode layer (at least a portion of which is translucent) disposed over the phosphor layer. The sequential application is accomplished such that it forms an electroluminescent component of the analytical test strip.
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