Invention Application
- Patent Title: Inspection device for inspecting thin plate container and method of inspecting thin plate container
- Patent Title (中): 薄板容器检查检查装置及薄板容器检验方法
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Application No.: US11730994Application Date: 2007-04-05
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Publication No.: US20070286598A1Publication Date: 2007-12-13
- Inventor: Katsuhiro Yoshino
- Applicant: Katsuhiro Yoshino
- Assignee: Oki Electric Industry Co., Ltd.,Miyazaki Oki Electric Industry Co., Ltd
- Current Assignee: Oki Electric Industry Co., Ltd.,Miyazaki Oki Electric Industry Co., Ltd
- Priority: JP2006-158899 20060607
- Main IPC: B41B17/00
- IPC: B41B17/00

Abstract:
An inspection device is used for inspecting a thin plate container having a stage guide with insulation property for supporting a thin plate one by one. The inspection device includes a conductive plate having an upper surface and a lower surface and supported on the stage guide; a shaft disposed above the upper surface or below the lower surface; and a contact member abutting against the conductive plate. The conductive plate, the shaft, and the contact member respectively have conductivity.
Public/Granted literature
- US07532004B2 Inspection device for inspecting thin plate container and method of inspecting thin plate container Public/Granted day:2009-05-12
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