发明申请
US20070278507A1 Field effect transistor and method for fabricating the same 有权
场效应晶体管及其制造方法

  • 专利标题: Field effect transistor and method for fabricating the same
  • 专利标题(中): 场效应晶体管及其制造方法
  • 申请号: US11730615
    申请日: 2007-04-03
  • 公开(公告)号: US20070278507A1
    公开(公告)日: 2007-12-06
  • 发明人: Satoshi NakazawaTetsuzo Ueda
  • 申请人: Satoshi NakazawaTetsuzo Ueda
  • 优先权: JP2006-151051 20060531
  • 主分类号: H01L29/22
  • IPC分类号: H01L29/22 H01L21/20
Field effect transistor and method for fabricating the same
摘要:
A field effect transistor includes a nitride semiconductor layered structure that is formed on a substrate and includes a capping layer made of a compound represented by a general formula of InxAlyGa1-yN (wherein 0
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