发明申请
- 专利标题: Optical detection alignment/tracking method and apparatus
- 专利标题(中): 光学检测对准/跟踪方法和装置
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申请号: US11385273申请日: 2006-03-21
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公开(公告)号: US20070220958A1公开(公告)日: 2007-09-27
- 发明人: Doug Gotthard , Ben Ohler
- 申请人: Doug Gotthard , Ben Ohler
- 申请人地址: US NY Woodbury
- 专利权人: Veeco Instruments Inc.
- 当前专利权人: Veeco Instruments Inc.
- 当前专利权人地址: US NY Woodbury
- 主分类号: G01B5/28
- IPC分类号: G01B5/28
摘要:
A method of operating a probe based instrument includes a light source that generates and directs a beam of light towards a probe of the instrument to detect a property of probe deflection. The method automatically adjusts the position of the light beam on the probe based on movement of the probe by a Z actuator so as to eliminate apparent parasitic deflection of the probe. A light source assembly for detecting deflection of a probe preferably includes a base, a tip/tilt stage mounted on the base and a light source supported by the tip/tilt stage. The tip/tilt stage includes at least one electrically actuated fine adjustment actuator that controls the tip/tilt stage, preferably independently of movement of the AFM scanner used to move the probe.
公开/授权文献
- US07478552B2 Optical detection alignment/tracking method and apparatus 公开/授权日:2009-01-20
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