- 专利标题： Detection with evanescent wave probe
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申请号： US11542830申请日： 2006-10-03
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公开(公告)号： US20070085541A1公开(公告)日： 2007-04-19
- 发明人: Xiao Dong Xiang , Haitao Yang , Gang Wang
- 申请人： Xiao Dong Xiang , Haitao Yang , Gang Wang
- 申请人地址： US CA Fremont
- 专利权人： Intematix Corporation
- 当前专利权人： Intematix Corporation
- 当前专利权人地址： US CA Fremont
- 主分类号： G01V3/00
- IPC分类号： G01V3/00
摘要：
Methods and systems for spatially resolved spin resonance detection in a sample of material are disclosed. Also disclosed are methods and systems for spatially resolved impedance measurements in a sample of material. The disclosed methods and samples can be used in screening of plurality of biological, chemical and material samples.
公开/授权文献
- US07268546B2 Detection with evanescent wave probe 公开/授权日：2007-09-11
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