Invention Application
- Patent Title: Part measurement prioritization system and method
- Patent Title (中): 零件测量优先系统和方法
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Application No.: US11203819Application Date: 2005-08-15
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Publication No.: US20060047457A1Publication Date: 2006-03-02
- Inventor: John Agapiou , Robert Aas , Pulak Bandyopadhyay
- Applicant: John Agapiou , Robert Aas , Pulak Bandyopadhyay
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A system, method, and apparatus are provided for prioritizing the measurements made on manufactured parts while maintaining specified part quality standards. According to the method, system and apparatus, the process used by the CMM is modified so that the number of measurements made is reduced in accordance with the results of the analysis provided herein. A CMM apparatus is modified in accordance with the analysis results. A method for part measurement prioritization in a measuring system and method includes describing a set of features to be measured on a plurality of substantially identical parts, separating the set of features into sensitive features and non-sensitive features, dividing the non-sensitive features into a plurality of groups, and prioritizing the part measurements to measure the sensitive features and provide alternating measurements of the non-sensitive features.
Public/Granted literature
- US07398179B2 Part measurement prioritization system and method Public/Granted day:2008-07-08
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