- 专利标题： Method of testing a memory module and hub of the memory module
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申请号： US11118377申请日： 2005-05-02
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公开(公告)号： US20060006419A1公开(公告)日： 2006-01-12
- 发明人: Seung-Man Shin , Byung-Se So , Seung-Jin Seo , You-Keun Han
- 申请人： Seung-Man Shin , Byung-Se So , Seung-Jin Seo , You-Keun Han
- 优先权： KR2004-43000 20040611; KR2005-1495 20050107
- 主分类号： H01L31/109
- IPC分类号： H01L31/109
摘要：
A method of testing a memory module comprising converting a hub of the memory module into a transparent mode, providing first data corresponding to a first address to the hub of the memory module, providing the first data of the hub of the memory module to a first address of a memory, providing first expected data to the hub of the memory module, outputting second data stored at the first address of the memory to the hub of the memory module, and comparing the second data with the first expected data.
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