发明申请
- 专利标题: Test systems or programs
- 专利标题(中): 测试系统或程序
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申请号: US10512694申请日: 2004-09-10
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公开(公告)号: US20050193263A1公开(公告)日: 2005-09-01
- 发明人: David Watt
- 申请人: David Watt
- 申请人地址: GB London
- 专利权人: BAE SYSTEMS plc
- 当前专利权人: BAE SYSTEMS plc
- 当前专利权人地址: GB London
- 优先权: GB0321559.7 20030915; GB0417323.3 20040804
- 国际申请: PCT/GB04/03882 WO 20040910
- 主分类号: G06F11/36
- IPC分类号: G06F11/36 ; G06F11/00
摘要:
Described herein is a method of generating a test program structure from test requirement data. The method comprises translating the test requirement data into a form suitable for execution within a test programming environment to generate a hierarchy of sequence files based on user supplied information. The test program comprises a plurality of Test Blocks and each Test Block comprises at least one Test.
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