发明申请
US20050193263A1 Test systems or programs 有权
测试系统或程序

  • 专利标题: Test systems or programs
  • 专利标题(中): 测试系统或程序
  • 申请号: US10512694
    申请日: 2004-09-10
  • 公开(公告)号: US20050193263A1
    公开(公告)日: 2005-09-01
  • 发明人: David Watt
  • 申请人: David Watt
  • 申请人地址: GB London
  • 专利权人: BAE SYSTEMS plc
  • 当前专利权人: BAE SYSTEMS plc
  • 当前专利权人地址: GB London
  • 优先权: GB0321559.7 20030915; GB0417323.3 20040804
  • 国际申请: PCT/GB04/03882 WO 20040910
  • 主分类号: G06F11/36
  • IPC分类号: G06F11/36 G06F11/00
Test systems or programs
摘要:
Described herein is a method of generating a test program structure from test requirement data. The method comprises translating the test requirement data into a form suitable for execution within a test programming environment to generate a hierarchy of sequence files based on user supplied information. The test program comprises a plurality of Test Blocks and each Test Block comprises at least one Test.
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