Invention Application
US20050190602A1 Semiconductor integrated circuit adapted to output pass/fail results of internal operations
有权
半导体集成电路适用于输出内部操作的通过/失败结果
- Patent Title: Semiconductor integrated circuit adapted to output pass/fail results of internal operations
- Patent Title (中): 半导体集成电路适用于输出内部操作的通过/失败结果
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Application No.: US11119744Application Date: 2005-05-03
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Publication No.: US20050190602A1Publication Date: 2005-09-01
- Inventor: Hiroshi Nakamura , Kenichi Imamiya , Toshio Yamamura , Koji Hosono , Koichi Kawai
- Applicant: Hiroshi Nakamura , Kenichi Imamiya , Toshio Yamamura , Koji Hosono , Koichi Kawai
- Priority: JP2001-386596 20011219; JP2002-311475 20021025
- Main IPC: G11C16/02
- IPC: G11C16/02 ; G11C7/06 ; G11C16/00 ; G11C16/04 ; G11C16/06 ; G11C16/10 ; G11C16/26
Abstract:
In a semiconductor integrated circuit, an internal circuit is capable of executing a first operation and a second operation concurrently, and an output circuit outputs to the outside of the semiconductor integrated circuit information indicating whether or not the first operation is being executed and information indicating whether or not the second operation is executable.
Public/Granted literature
- US07123515B2 Semiconductor integrated circuit adapted to output pass/fail results of internal operations Public/Granted day:2006-10-17
Information query
