发明申请
US20050095770A1 Cvd method and device for forming silicon-containing insulation film
有权
Cvd方法和用于形成含硅绝缘膜的装置
- 专利标题: Cvd method and device for forming silicon-containing insulation film
- 专利标题(中): Cvd方法和用于形成含硅绝缘膜的装置
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申请号: US10500150申请日: 2003-01-14
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公开(公告)号: US20050095770A1公开(公告)日: 2005-05-05
- 发明人: Takeshi Kumagai , Hitoshi Katoh , Jinsu Lee , Shingo Maku
- 申请人: Takeshi Kumagai , Hitoshi Katoh , Jinsu Lee , Shingo Maku
- 优先权: JP2002005827 20020115
- 国际申请: PCT/JP03/00206 WO 20030114
- 主分类号: C23C16/30
- IPC分类号: C23C16/30 ; C23C16/34 ; C23C16/40 ; C23C16/452 ; H01L21/8238
摘要:
A CVD apparatus (2) forms an insulating film, which is a silicon oxide film, silicon nitride film, or silicon oxynitride film. The CVD apparatus includes a process chamber (8) to accommodate a target substrate (W), a support member (20) to support the target substrate in the process chamber, a heater (12) to heat the target substrate supported by the support member, an exhaust section (39) to vacuum-exhaust the process chamber, and a supply section (40) to supply a gas into the process chamber. The supply section includes a first circuit (42) to supply a first gas of a silane family gas, a second circuit (44) to supply a second gas, which is an oxidizing gas, nitriding gas, or oxynitriding gas, and a third circuit (46) to supply a third gas of a carbon hydride gas, and can supply the first, second, and third gases together.
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