Invention Application
US20030107819A1 3D SHAPE-MEASURING APPARATUS USING BIAXIAL ANAMORPHIC MAGNIFICATION
有权
使用双相异质放大的3D形状测量装置
- Patent Title: 3D SHAPE-MEASURING APPARATUS USING BIAXIAL ANAMORPHIC MAGNIFICATION
- Patent Title (中): 使用双相异质放大的3D形状测量装置
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Application No.: US10126582Application Date: 2002-04-22
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Publication No.: US20030107819A1Publication Date: 2003-06-12
- Inventor: Ming-Hui Lin , Tung-Fa Liou
- Applicant: Industrial Technology Research Institute
- Applicant Address: TW Hsin-Chu Hsien
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsin-Chu Hsien
- Priority: TW090130271 20011207
- Main IPC: G02B013/08
- IPC: G02B013/08

Abstract:
A 3D shape-measuring apparatus using biaxial anamorphic magnification comprises a light source that projects a light onto an object surface to be sensed. Via an electrical image-grabbing device, such as CCD camera, the light reflected from the object is grabbed to determine the coordinate locations sensed on the object. Before the electrical image-grabbing device, the light reflected from the object passes respectively through a curved reflecting mirror or an assembly of telecentric cylindrical lenses to adjust an image magnification along the light projection direction, and an assembly of cylindrical lenses to adjust an image magnification along a direction perpendicular to the light projection direction. Thereby, resolution nonuniformity with respect to near and far distance is resolved while the observable range of the CCD camera can further be efficiently changed into a measurable field.
Public/Granted literature
- US06574050B1 3D shape-measuring apparatus using biaxial anamorphic magnification Public/Granted day:2003-06-03
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