- Patent Title: Method and apparatus for high resolution measurement of a workpiece
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Application No.: US17771597Application Date: 2020-10-29
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Publication No.: US12299909B2Publication Date: 2025-05-13
- Inventor: Jeffrey Thomas Drake , Russell Wayne Madara , Brett Christopher Shelton , Jay Katsuhiko Stearns , Eric Daniel Treacy , David John Worthey , Amanda Nicole Yoder
- Applicant: CORNING INCORPORATED
- Applicant Address: US NY Corning
- Assignee: CORNING INCORPORATED
- Current Assignee: CORNING INCORPORATED
- Current Assignee Address: US NY Corning
- Agent Kevin M. Able
- International Application: PCT/US2020/057838 WO 20201029
- International Announcement: WO2021/087029 WO 20210506
- Main IPC: G06T7/33
- IPC: G06T7/33 ; G06T7/00 ; G06T7/62
Abstract:
Methods and systems are described herein for inspection of a workpiece, such as a honeycomb body. The methods and systems include collecting a plurality of images of the honeycomb body, extracting measurement data from each of the plurality of images, converting the measurement data extracted from each image into a common frame of reference, and combining the measurement data together.
Public/Granted literature
- US20220366579A1 METHOD AND APPARATUS FOR HIGH RESOLUTION MEASUREMENT OF A WORKPIECE Public/Granted day:2022-11-17
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