Invention Grant
- Patent Title: Method for evaluating parameter of interfering signal and detection apparatus
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Application No.: US17827288Application Date: 2022-05-27
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Publication No.: US12204043B2Publication Date: 2025-01-21
- Inventor: Leilei Xu , Boya Qin
- Applicant: Shenzhen Yinwang Intelligent Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Shenzhen Yinwang Intelligent Technologies Co., Ltd.
- Current Assignee: Shenzhen Yinwang Intelligent Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Conley Rose, P.C.
- Priority: CN201911186342.6 20191128
- Main IPC: G01S7/02
- IPC: G01S7/02 ; G01S13/931
Abstract:
A method for evaluating a parameter of an interfering signal includes: determining a slope of an interfering signal; setting the slope of the interfering signal as a slope of a first transmission signal; and determining a parameter of the interfering signal based on a feature of an echo signal of the first transmission signal.
Public/Granted literature
- US20220291330A1 Method for Evaluating Parameter of Interfering Signal and Detection Apparatus Public/Granted day:2022-09-15
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