Invention Grant
- Patent Title: Probe module for inspecting display panel, panel inspection apparatus including the same, and panel correction method of panel inspection apparatus
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Application No.: US17531160Application Date: 2021-11-19
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Publication No.: US12175942B2Publication Date: 2024-12-24
- Inventor: Ho Min Lim
- Applicant: LX Semicon Co., Ltd.
- Applicant Address: KR Daejeon
- Assignee: LX Semicon Co., Ltd.
- Current Assignee: LX Semicon Co., Ltd.
- Current Assignee Address: KR Daejeon
- Agency: ROTHWELL, FIGG, ERNST & MANBECK, P.C.
- Priority: KR10-2020-0159807 20201125
- Main IPC: G09G3/3291
- IPC: G09G3/3291 ; G01R31/26
Abstract:
Provided are a probe module for inspecting a display panel, a panel inspection apparatus including the same, and a panel correction method of the panel inspection apparatus, which are provided to correct a display panel selected as a defective display panel during manufacturing of the display panel, thereby improving manufacturing yield of the display panel.
Public/Granted literature
Information query
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