Invention Grant
- Patent Title: Inspection apparatus, inspection method and program
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Application No.: US17795304Application Date: 2020-01-27
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Publication No.: US12130949B2Publication Date: 2024-10-29
- Inventor: Yoshihide Nakagawa
- Applicant: Nippon Telegraph and Telephone Corporation
- Applicant Address: JP Tokyo
- Assignee: Nippon Telegraph and Telephone Corporation
- Current Assignee: Nippon Telegraph and Telephone Corporation
- Current Assignee Address: JP Tokyo
- Agency: Fish & Richardson P.C.
- International Application: PCT/JP2020/002671 2020.01.27
- International Announcement: WO2021/152647A 2021.08.05
- Date entered country: 2022-07-26
- Main IPC: G06F21/64
- IPC: G06F21/64

Abstract:
An inspection device supports work related to ensuring security by including: a conversion unit that converts a regular expression of a first signature into a first representation by a nondeterministic finite automaton and converts a regular expression of a second signature into a second representation by a nondeterministic finite automaton; a determination unit that determines the presence or absence of an inclusive relationship between the first representation and the second representation; and an output unit that when a result of determination by the determination unit indicates that the first representation and the second representation have an inclusive relationship, outputs information indicating that the first signature and the second signature have the inclusive relationship.
Public/Granted literature
- US20230088671A1 INSPECTION APPARATUS, INSPECTION METHOD AND PROGRAM Public/Granted day:2023-03-23
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