- 专利标题: Inspection apparatus and measurement apparatus
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申请号: US17749331申请日: 2022-05-20
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公开(公告)号: US12125176B2公开(公告)日: 2024-10-22
- 发明人: Kosuke Fukuda , Masayoshi Ishikawa , Yasuhiro Yoshida , Hiroyuki Shindo
- 申请人: Hitachi High-Tech Corporation
- 申请人地址: JP Tokyo
- 专利权人: HITACHI HIGH-TECH CORPORATION
- 当前专利权人: HITACHI HIGH-TECH CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: MATTINGLY & MALUR, PC
- 优先权: JP 21107415 2021.06.29
- 主分类号: G06T5/70
- IPC分类号: G06T5/70 ; G06T3/40 ; G06T7/00 ; G06T7/62
摘要:
An inspection apparatus includes an image distortion estimation unit that estimates a distortion amount between a reference image and an inspection image, an image distortion correction unit that corrects the inspection image and/or the reference image using an estimated distortion amount, and an inspection unit that performs inspection using a corrected inspection image and the reference image or the inspection image and a corrected reference image. The image distortion estimation unit estimates a distortion amount in which only distortion occurring in an entire image can be corrected by adjustment of a correction condition.
公开/授权文献
- US20220414833A1 INSPECTION APPARATUS AND MEASUREMENT APPARATUS 公开/授权日:2022-12-29
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