发明授权
- 专利标题: Ion detector
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申请号: US17743563申请日: 2022-05-13
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公开(公告)号: US12112932B2公开(公告)日: 2024-10-08
- 发明人: Takeshi Endo , Hiroshi Kobayashi
- 申请人: HAMAMATSU PHOTONICS K.K.
- 申请人地址: JP Hamamatsu
- 专利权人: HAMAMATSU PHOTONICS K.K.
- 当前专利权人: HAMAMATSU PHOTONICS K.K.
- 当前专利权人地址: JP Hamamatsu
- 代理机构: Faegre Drinker Biddle & Reath LLP
- 优先权: JP 21110138 2021.07.01
- 主分类号: H01J43/30
- IPC分类号: H01J43/30 ; H01J43/12
摘要:
An ion detector includes: a first electron multiplier for detecting first ions having a first polarity; a second electron multiplier for detecting second ions having a second polarity different from the first polarity; a first anode for capturing electrons emitted from the first electron multiplier; a second anode for capturing electrons emitted from the second electron multiplier; and a switching circuit including a first input terminal electrically connected to the first anode, a second input terminal electrically connected to the second anode, and an output terminal, the switching circuit selectively connecting one of the first input terminal and the second input terminal to the output terminal.
公开/授权文献
- US20230005726A1 ION DETECTOR 公开/授权日:2023-01-05
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