Invention Grant
- Patent Title: Optical measurement device with universal metasurface and optical measuring method using the same
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Application No.: US18232506Application Date: 2023-08-10
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Publication No.: US12104948B2Publication Date: 2024-10-01
- Inventor: Jonghwa Shin , Taeyong Chang , Joonkyo Jung
- Applicant: KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
- Applicant Address: KR Daejeon
- Assignee: Korea Advanced Institute of Science and Technology
- Current Assignee: Korea Advanced Institute of Science and Technology
- Current Assignee Address: KR Daejeon
- Agency: NSIP Law
- Priority: KR 20210018841 2021.02.10 KR 20220017236 2022.02.10
- Main IPC: G01J1/04
- IPC: G01J1/04 ; G01J4/00 ; G01J9/02 ; G02B21/00

Abstract:
An optical measurement device according to an aspect of the present disclosure includes a universal metasurface on which light is incident, a polarization sensor configured to measure a polarization state of light passing through the universal metasurface, and a controller configured to collect a quantitative differential interference contrast (QDIC) image for the x polarization of incident light that is collected by the polarization sensor, a QDIC image for y polarization, and a quantitative relative phase (QRP) image representing a relative phase difference between the x polarization and y polarization and configured to calculate intensity, a phase or polarization information of the incident light.
Public/Granted literature
- US20230384152A1 OPTICAL MEASUREMENT DEVICE WITH UNIVERSAL METASURFACE AND OPTICAL MEASURING METHOD USING THE SAME Public/Granted day:2023-11-30
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