- 专利标题: Lower layer beam failure indicators for wireless communications
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申请号: US17241005申请日: 2021-04-26
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公开(公告)号: US12082283B2公开(公告)日: 2024-09-03
- 发明人: Shanyu Zhou , Jelena Damnjanovic , Aleksandar Damnjanovic , Junyi Li , Juan Montojo , Tao Luo , Olufunmilola Omolade Awoniyi-Oteri , Sony Akkarakaran , Yan Zhou
- 申请人: QUALCOMM Incorporated
- 申请人地址: US CA San Diego
- 专利权人: QUALCOMM Incorporated
- 当前专利权人: QUALCOMM Incorporated
- 当前专利权人地址: US CA San Diego
- 代理机构: QUALCOMM Incorporated
- 主分类号: H04W76/18
- IPC分类号: H04W76/18 ; H04L5/00 ; H04W24/08
摘要:
Methods, systems, and devices for wireless communications are described. In some wireless communications systems, a user equipment (UE) may receive, from a base station, a configuration indicating a channel quality threshold that the UE may use to identify an interference-based beam failure indicator type. The UE may receive a reference signal for performing one or more signal measurements in accordance with the configuration. Based on the one or more signal measurements and the channel quality threshold, the UE may report an indication of the type of beam failure indicator to the base station.
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