Invention Grant
- Patent Title: Heat dissipation in semiconductor packages and methods of forming same
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Application No.: US18074027Application Date: 2022-12-02
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Publication No.: US12074148B2Publication Date: 2024-08-27
- Inventor: Fong-Yuan Chang , Po-Hsiang Huang , Lee-Chung Lu , Jyh Chwen Frank Lee , Yii-Chian Lu , Yu-Hao Chen , Keh-Jeng Chang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- Main IPC: H01L25/10
- IPC: H01L25/10 ; H01L21/48 ; H01L21/56 ; H01L21/683 ; H01L23/00 ; H01L23/31 ; H01L23/367 ; H01L23/538 ; H01L25/00 ; H01L25/065

Abstract:
A semiconductor package includes a first package component comprising: a first semiconductor die; a first encapsulant around the first semiconductor die; and a first redistribution structure electrically connected to the semiconductor die. The semiconductor package further includes a second package component bonded to the first package component, wherein the second package component comprises a second semiconductor die; a heat spreader between the first semiconductor die and the second package component; and a second encapsulant between the first package component and the second package component, wherein the second encapsulant has a lower thermal conductivity than the heat spreader.
Public/Granted literature
- US1722834A Internal-micrometer gauge Public/Granted day:1929-07-30
Information query
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