发明授权
- 专利标题: Die attach surface copper layer with protective layer for microelectronic devices
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申请号: US16793887申请日: 2020-02-18
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公开(公告)号: US12074096B2公开(公告)日: 2024-08-27
- 发明人: Christopher Daniel Manack , Nazila Dadvand , Salvatore Pavone
- 申请人: Texas Instruments Incorporated
- 申请人地址: US TX Dallas
- 专利权人: TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人: TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人地址: US TX Dallas
- 代理商 Dawn Jos; Frank D. Cimino
- 主分类号: H01L23/495
- IPC分类号: H01L23/495 ; H01L21/683 ; H01L23/00 ; H01L23/36 ; H01L23/49 ; H01L23/492 ; H01L23/532
摘要:
A microelectronic device is formed by thinning a substrate of the microelectronic device from a die attach surface of the substrate, and forming a copper-containing layer on the die attach surface of the substrate. A protective metal layer is formed on the copper-containing layer. Subsequently, the copper-containing layer is attached to a package member having a package die mount area. The protective metal layer may optionally be removed prior to attaching the copper-containing layer to the package member. Alternatively, the protective metal layer may be left on the copper-containing layer when the copper-containing layer is attached to the package member. A structure formed by the method is also disclosed.
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