- 专利标题: Semiconductor device and method for forming the same
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申请号: US18335816申请日: 2023-06-15
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公开(公告)号: US12022665B2公开(公告)日: 2024-06-25
- 发明人: Shy-Jay Lin , Chien-Min Lee , Hiroki Noguchi , MingYuan Song , Yen-Lin Huang , William Joseph Gallagher
- 申请人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Slater Matsil, LLP
- 分案原申请号: US17216162 2021.03.29
- 主分类号: H01L21/00
- IPC分类号: H01L21/00 ; H01L21/768 ; H01L21/8234 ; H01L23/528 ; H10B61/00
摘要:
A device includes a substrate having a first side and a second side, a first transistor that includes a first gate over a first protrusion and a first source region and a first drain region interposing the first protrusion, a first buried contact disposed adjacent to the first protrusion and having at least a portion extending into the substrate, a first contact plug disposed over the first drain region, first conductive lines disposed over the first contact plug and electrically connecting to the first drain region by the first contact plug, first via penetrating through the substrate and connecting the first buried contact; and second conductive lines disposed over the second side of the substrate and electrically connecting to the first via. The first buried contact is electrically connecting to the first source region or the first gate.
公开/授权文献
- US20230345738A1 SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME 公开/授权日:2023-10-26
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