- 专利标题: Apparatus for measuring radon and thoron by using ionization chamber
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申请号: US16973418申请日: 2019-10-24
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公开(公告)号: US12013500B2公开(公告)日: 2024-06-18
- 发明人: Jae Jun Ko , Young Gweon Kim
- 申请人: FTLAB CO., LTD.
- 申请人地址: KR Ansan-si
- 专利权人: FTLAB CO., LTD.
- 当前专利权人: FTLAB CO., LTD.
- 当前专利权人地址: KR Ansan-si
- 代理机构: ArentFox Schiff LLP
- 优先权: KR 20180165343 2018.12.19
- 国际申请: PCT/KR2019/014018 2019.10.24
- 国际公布: WO2020/130317A 2020.06.25
- 进入国家日期: 2020-12-08
- 主分类号: G01T1/185
- IPC分类号: G01T1/185 ; G01T1/178 ; G01T1/24 ; H01J47/02
摘要:
An apparatus for measuring radon and thoron using an ionization chamber is proposed. The apparatus includes: a pump for air inflow suctioning and sending external air to at least one channel; a first sensor module outputting an alpha particle detection signal of an electrical signal by detecting alpha (α) particles discharged from radon and thoron; an air inflow delay module delaying air for a predetermined delay time and then outputting the air; a second sensor module outputting an alpha particle detection signal of an electrical signal by detecting alpha (α) particles discharged from radon and thoron; and a control module discriminating normal or abnormal alpha particle detection signals, counting the normal alpha particle detection signals discriminated for a predetermined measurement time, and calculating radioactive ray concentration values on the basis of the counted number of times of the normal alpha particle detection signals.
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