- 专利标题: Structure for microbe detection, manufacturing method therefor, and microbe detection method using same structure for microbe detection
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申请号: US17044878申请日: 2018-05-16
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公开(公告)号: US11940446B2公开(公告)日: 2024-03-26
- 发明人: Jong-Ho Kim , Tae Woog Kang , Sin Lee , In Jun Hwang , Ju Hee Han
- 申请人: INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY ERICA CAMPUS
- 申请人地址: KR Ansan-Si
- 专利权人: INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY ERICA CAMPUS
- 当前专利权人: INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY ERICA CAMPUS
- 当前专利权人地址: KR Ansan-Si
- 代理机构: Finch & Maloney PLLC
- 优先权: KR 20180038652 2018.04.03
- 国际申请: PCT/KR2018/005603 2018.05.16
- 国际公布: WO2019/194352A 2019.10.10
- 进入国家日期: 2020-10-02
- 主分类号: G01N33/569
- IPC分类号: G01N33/569 ; C01B19/00 ; C01G41/00 ; G01N21/64 ; G01N21/65
摘要:
A method for manufacturing a structure for microbe detection comprises the steps of: reacting nitrilotriacetic acid (NTA) and an acid anhydride to prepare a first compound; chelation of metal ions to the first compound to prepare a second compound; binding the second compound and a microbe detector to prepare a third compound; and mixing an exfoliated transition metal-dichalcogenide (TMD) compound and the third compound to prepare a structure for microbe detection, in which the metal ions of the third compound are bound with the transition metal-dichalcogenide compound.
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