• Patent Title: Methods, (measuring) devices, and components thereof, for identifying events in a material-processing or material production process using event patterns
  • Application No.: US16965339
    Application Date: 2018-12-11
  • Publication No.: US11931842B2
    Publication Date: 2024-03-19
  • Inventor: Ulrich Seuthe
  • Applicant: QASS GMBH
  • Applicant Address: DE Wetter
  • Assignee: Qass GmbH
  • Current Assignee: Qass GmbH
  • Current Assignee Address: DE Wetter
  • Agency: UBG Law
  • Agent Brian E. Turung
  • Priority: DE 2017011368.8 2017.12.11
  • International Application: PCT/EP2018/084411 2018.12.11
  • International Announcement: WO2019/115553A 2019.06.20
  • Date entered country: 2020-08-07
  • Main IPC: B23Q17/09
  • IPC: B23Q17/09 G01D5/00 G05B19/418 G05B23/02 G06F8/34 G05B19/04 G06F3/0481 G06F8/20
Methods, (measuring) devices, and components thereof, for identifying events in a material-processing or material production process using event patterns
Abstract:
A measuring device comprising a sensor for the high frequency detection of a measurement variable, such as sound, structure-borne noise, current, voltage, optical or magnetic measurement values and the like, with an operator network comprising at least one operator. An operator network that includes a notification operator, a machine control operator and/or a difference operator. The devices can be configured to identify events in a material-processing and/or material production process on the basis of a multidimensional data stream obtained during the process and having temporally resolved frequency and energy information, and to the use of defect patterns and/or event patterns and/or energy data, the data being supplied to a pattern operator or multiple pattern operators arranged in parallel or one after the other.
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