Provided is a pressure-sensitive adhesive sheet for semiconductor wafer processing that is excellent in adhesiveness with a semiconductor wafer, and that has light peelability and suppresses adhesive residue. The pressure-sensitive adhesive sheet for semiconductor wafer processing includes in this order: a base material; an intermediate layer; and a UV-curable pressure-sensitive adhesive layer. The intermediate layer has a storage modulus of elasticity at room temperature, G′1RT, of from 300 kPa to 2,000 kPa, and a storage modulus of elasticity at 80° C., G′180, of from 10 kPa to 500 kPa. The UV-curable pressure-sensitive adhesive layer has a storage modulus of elasticity at room temperature, G′2RT, of from 100 kPa to 1,000 kPa, and a storage modulus of elasticity at 80° C., G′280, of from 10 kPa to 1,000 kPa. G′1RT/G′2RT is 1 or more.