- 专利标题: Leave-in etch mask for foil-based metallization of solar cells
-
申请号: US17082995申请日: 2020-10-28
-
公开(公告)号: US11894472B2公开(公告)日: 2024-02-06
- 发明人: Richard Hamilton Sewell , David Fredric Joel Kavulak , Taeseok Kim , Gabriel Harley
- 申请人: Maxeon Solar Pte. Ltd.
- 申请人地址: SG Singapore
- 专利权人: Maxeon Solar Pte. Ltd.
- 当前专利权人: Maxeon Solar Pte. Ltd.
- 当前专利权人地址: SG Singapore
- 代理机构: Schwabe, Williamson & Wyatt, P.C.
- 主分类号: H01L31/0224
- IPC分类号: H01L31/0224 ; H01L31/068 ; H01L31/18
摘要:
Approaches for fabricating foil-based metallization of solar cells based on a leave-in etch mask, and the resulting solar cells, are described. In an example, a solar cell includes a substrate having a back surface and an opposing light-receiving surface. A plurality of alternating N-type and P-type semiconductor regions is disposed in or above the back surface of the substrate. A conductive contact structure is disposed on the plurality of alternating N-type and P-type semiconductor regions. The conductive contact structure includes metal foil portions in alignment with corresponding ones of the alternating N-type and P-type semiconductor regions. A patterned wet etchant-resistant polymer layer is disposed on the conductive contact structure. Portions of the patterned wet etchant-resistant polymer layer are disposed on and in alignment with the metal foil portions.
公开/授权文献
信息查询
IPC分类: