发明授权
- 专利标题: Profiling a program based on a combination of dynamic instrumentation and sampling
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申请号: US17718129申请日: 2022-04-11
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公开(公告)号: US11892936B2公开(公告)日: 2024-02-06
- 发明人: Patrick Lothian Nelson , Nikolaus Lee Karpinsky , Liqi Han
- 申请人: Microsoft Technology Licensing, LLC
- 申请人地址: US WA Redmond
- 专利权人: Microsoft Tech nology Licensing, LLC
- 当前专利权人: Microsoft Tech nology Licensing, LLC
- 当前专利权人地址: US WA Redmond
- 代理机构: Workman Nydegger
- 主分类号: G06F11/36
- IPC分类号: G06F11/36 ; G06F8/41
摘要:
A computer system is configured to profile a program during an execution of the program. Profiling the program includes obtaining, by a first profiler, a first set of information associated with the execution of the program, and obtaining a second set of information associated with one or more executions of the function. The second set of information includes at least a call count or an execution time of each of the one or more executions of the function. The computer system then identifies a subset of the first set of information that is associated with the one or more executions of the function, and creates aggregate information based on the subset of the first set of information and the second set of information. The aggregated information is then reported.
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