- 专利标题: Magnetic resonance measurement apparatus
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申请号: US17275605申请日: 2019-09-10
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公开(公告)号: US11852702B2公开(公告)日: 2023-12-26
- 发明人: Masato Takahashi
- 申请人: RIKEN
- 申请人地址: JP Wako
- 专利权人: RIKEN
- 当前专利权人: RIKEN
- 当前专利权人地址: JP Wako
- 代理机构: Birch, Stewart, Kolasch & Birch, LLP
- 优先权: JP 18171745 2018.09.13
- 国际申请: PCT/JP2019/035446 2019.09.10
- 国际公布: WO2020/054686A 2020.03.19
- 进入国家日期: 2021-03-11
- 主分类号: G01R33/36
- IPC分类号: G01R33/36 ; G01R33/34
摘要:
A magnetic resonance measurement apparatus according to the present invention includes a first LC circuit that forms an oscillating magnetic field that causes an object to exhibit magnetic resonance. The first LC circuit includes a parallel connection assembly including a diode. The parallel connection assembly further includes a diode connected, in parallel and in reverse direction, to the diode, or an inductor connected in parallel to the diode. In a first state in which oscillating voltage for forming the oscillating magnetic field is applied to the first LC circuit, the diode of the parallel connection assembly functions as a short-circuit such that the resonance frequency of the first LC circuit becomes a first resonance frequency. In a second state in which oscillating voltage is not applied to the first LC circuit, the diode of the parallel connection assembly functions as capacitance such that the resonance frequency of the first LC circuit becomes a second resonance frequency that is different from the first resonance frequency.
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