Invention Grant
- Patent Title: Three-dimensional depth measuring device and method
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Application No.: US17309033Application Date: 2019-10-28
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Publication No.: US11846500B2Publication Date: 2023-12-19
- Inventor: Kostiantyn Morozov , Oleksandr Klimenkov , Dmytro Vavdiiuk , Ivan Safonov , Andrii But , Andrii Sukhariev , Ruslan Iermolenko , Serhii Iliukhin , Yaroslav Lavrenyuk
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Priority: KR 20180130292 2018.10.29
- International Application: PCT/KR2019/014287 2019.10.28
- International Announcement: WO2020/091347A 2020.05.07
- Date entered country: 2021-04-15
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01B11/25 ; G06T7/521 ; G06T7/557

Abstract:
A three-dimensional depth measuring method using a structured light camera comprising a first projector, a second projector, and an optical sensor, according to the present disclosure, comprises: a step in which a first light pattern is projected by the first projector; a step in which a second light pattern is projected by the second projector; a step of filtering, by a color filter, a third light pattern in which the first light pattern and the second light pattern reflected from an object overlap, so as to separate the third light pattern into a first filtered pattern and a second filtered pattern; a step of localizing the first filtered pattern and classifying first feature points of the first filtered pattern; a step of localizing the second filtered pattern and classifying second feature points of the second filtered pattern; and a step of obtaining position information of the object on the basis of the first feature points and the second feature points.
Public/Granted literature
- US20220011096A1 THREE-DIMENSIONAL DEPTH MEASURING DEVICE AND METHOD Public/Granted day:2022-01-13
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