Invention Grant
- Patent Title: Automatic analysis apparatus and method of controlling automatic analysis apparatus
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Application No.: US17229191Application Date: 2021-04-13
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Publication No.: US11828765B2Publication Date: 2023-11-28
- Inventor: Tamami Kaneda , Makoto Asakura
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: THE WEBB LAW FIRM
- Priority: JP 20072338 2020.04.14
- Main IPC: G01N35/00
- IPC: G01N35/00

Abstract:
An automatic analysis apparatus of the present invention includes: a measurement section that measures a sample; a remaining quantity detecting section that detects that a remaining quantity of a consumable article used in the measurement section has become less than or equal to a predetermined quantity that is set in advance; a setting section that is capable of setting in which mode, of a first mode and a second mode applied for operation control of the measurement section, to operate the measurement section for each consumable article when the remaining quantity detecting section detects that the remaining quantity of the consumable article has become less than or equal to the predetermined quantity; and a control section that controls operation of the measurement section based on the setting of the setting section.
Public/Granted literature
- US20210318345A1 Automatic Analysis Apparatus and Method of Controlling Automatic Analysis Apparatus Public/Granted day:2021-10-14
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