- 专利标题: Radon measuring apparatus and method
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申请号: US17832641申请日: 2022-06-04
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公开(公告)号: US11719833B2公开(公告)日: 2023-08-08
- 发明人: Sang In Kim , Hyun Keun Lim , Eun Jung Yun
- 申请人: ARIM SCIENCE CO.
- 申请人地址: KR Daejeon
- 专利权人: ARIM SCIENCE CO.
- 当前专利权人: ARIM SCIENCE CO.
- 当前专利权人地址: KR Daejeon
- 代理机构: Insight Law Group, PLLC
- 代理商 Seung Lee
- 优先权: KR 20190170936 2019.12.19
- 主分类号: G01T1/178
- IPC分类号: G01T1/178 ; G01T7/04
摘要:
Disclosed are a radon measuring apparatus and method. A radon measuring apparatus according to the present invention can comprise: a housing having two separate spaces and through holes formed such that each space communicates with the outside; a probe unit having first and second probe rods which are respectively disposed inside each space in the opposite direction from each other inside the housing; a control unit disposed inside the housing and connected to the probe unit; and a switching unit for controlling the electrical connection between the first and second probe rods.
公开/授权文献
- US20220299660A1 RADON MEASURING APPARATUS AND METHOD 公开/授权日:2022-09-22
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