- 专利标题: Sensor for measuring a magnetic field
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申请号: US17739066申请日: 2022-05-06
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公开(公告)号: US11719765B2公开(公告)日: 2023-08-08
- 发明人: Tim Schröder , Felipe Perona Martinez , Julian Bopp , Moritz Kleinert , Hauke Conradi
- 申请人: Humboldt-Universität zu Berlin , Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
- 申请人地址: DE Berlin
- 专利权人: Humboldt-Universität zu Berlin,Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e. V.
- 当前专利权人: Humboldt-Universität zu Berlin,Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e. V.
- 当前专利权人地址: DE Berlin; DE Munich
- 代理机构: Mansukhani, LLP
- 代理商 Gordon Rees Scully
- 优先权: EP 177745 2021.06.04
- 主分类号: G01R33/32
- IPC分类号: G01R33/32 ; G01R33/032 ; G01R33/02
摘要:
An embodiment of the invention relates to a sensor comprising a sensor element (10) for measuring a magnetic field, the sensor element (10) comprising a set of at least two first input ports (I1), a set of at least two exit ports (E) each of which is connected to one of the first input ports (I1) via a corresponding first beam path (B1), a set of at least two second input ports (I2) each of which is connected to a second beam path (B2), wherein the first beam paths (B1) extend through a common plane (CP) located inside the sensor element (10), said plane (CP) comprising a plurality of magneto-optically responsive defect centers, wherein the second beam paths (B2) also extend through said common plane (CP), but are angled with respect to the first beam paths (B1) such that a plurality of intersections between the first and second beam paths (B2) is defined, and wherein each intersection forms a sensor pixel (P) located at at least one of said magneto-optically responsive defect centers.
公开/授权文献
- US20220390529A1 SENSOR FOR MEASURING A MAGNETIC FIELD 公开/授权日:2022-12-08
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