Invention Grant
- Patent Title: Liveness test method and apparatus
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Application No.: US17468995Application Date: 2021-09-08
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Publication No.: US11682240B2Publication Date: 2023-06-20
- Inventor: Byungin Yoo , Jingtao Xu , Chao Zhang , Hao Feng , Yanhu Shan , Youngjun Kwak , Youngsung Kim , Wonsuk Chang , Jaejoon Han
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR 20170038347 2017.03.27
- Main IPC: G06V40/40
- IPC: G06V40/40 ; G06V40/16

Abstract:
A liveness test method and apparatus is disclosed. The liveness test method includes detecting a face region in an input image for a test target, implementing a first liveness test to determine a first liveness value based on a first image corresponding to the detected face region, implementing a second liveness test to determine a second liveness value based on a second image corresponding to a partial face region of the detected face region, implementing a third liveness test to determine a third liveness value based on an entirety of the input image or a full region of the input image that includes the detected face region and a region beyond the detected face region, and determining a result of the liveness test based on the first liveness value, the second liveness value, and the third liveness value.
Public/Granted literature
- US11721131B2 Liveness test method and apparatus Public/Granted day:2023-08-08
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