- 专利标题: Apparatuses, systems, and methods for error correction
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申请号: US17500666申请日: 2021-10-13
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公开(公告)号: US11645150B2公开(公告)日: 2023-05-09
- 发明人: Toru Ishikawa , Minari Arai
- 申请人: MICRON TECHNOLOGY, INC.
- 申请人地址: US ID Boise
- 专利权人: MICRON TECHNOLOGY, INC.
- 当前专利权人: MICRON TECHNOLOGY, INC.
- 当前专利权人地址: US ID Boise
- 代理机构: Dorsey & Whitney LLP
- 主分类号: G06F3/06
- IPC分类号: G06F3/06 ; G06F11/10 ; G06N3/08 ; G06N3/10 ; G06N3/04 ; G11C11/408 ; G11C11/4096
摘要:
Apparatuses, systems, and methods for error correction. A memory device may have a number of memory cells each of which stores a bit of information. One or more error correction code (ECC) may be used to determine if the bits of information contain any errors. To mitigate the effects of failures of adjacent memory cells, the information may be divided into a first group and a second group, where each group contains information from memory cells which are non-adjacent to other memory cells of that group. Each group of information may include data bits and parity bits used to correct those data bits. For example, as part of a read operation, a first ECC circuit may receive information from even numbered memory cells, while a second ECC circuit may receive information from odd numbered memory cells.
公开/授权文献
- US20220066875A1 APPARATUSES, SYSTEMS, AND METHODS FOR ERROR CORRECTION 公开/授权日:2022-03-03
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