- 专利标题: Magnetic measuring device
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申请号: US17274604申请日: 2019-10-15
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公开(公告)号: US11604235B2公开(公告)日: 2023-03-14
- 发明人: Mutsuko Hatano , Takayuki Iwasaki , Yoshie Harada , Yuji Hatano
- 申请人: TOKYO INSTITUTE OF TECHNOLOGY , OSAKA UNIVERSITY
- 申请人地址: JP Tokyo; JP Osaka
- 专利权人: TOKYO INSTITUTE OF TECHNOLOGY,OSAKA UNIVERSITY
- 当前专利权人: TOKYO INSTITUTE OF TECHNOLOGY,OSAKA UNIVERSITY
- 当前专利权人地址: JP Tokyo; JP Osaka
- 代理机构: Myers Wolin, LLC
- 优先权: JPJP2018-195324 20181016
- 国际申请: PCT/JP2019/040499 WO 20191015
- 国际公布: WO2020/080362 WO 20200423
- 主分类号: G01R33/24
- IPC分类号: G01R33/24 ; G01N21/64
摘要:
A magnetic measuring device includes: a determination part configured to identify four maximum inclination points in an average value in a visual field of a light detection magnetic resonance spectrum and configured to determined a degree of decrease in relative fluorescence intensity and a microwave frequency at each of the maximum inclination points; a setting part configured to set a reference decrease degree of the relative fluorescence intensity in a predetermined area and configured to set operating point frequency initial values at four points at which the reference decrease degree is achieved, near the microwave frequencies at the respective maximum inclination points; a frequency update part configured to update operating point frequencies at the four points; and a frequency correction part configured to input the updated operating point frequencies to a microwave oscillator as corrected operating point frequencies.
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