- 专利标题: Method and system for integrity testing of sachets
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申请号: US17050916申请日: 2019-04-24
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公开(公告)号: US11585775B2公开(公告)日: 2023-02-21
- 发明人: Hari Krishna Salila Vijayalal Mohan , Voon Yew Aaron Thean , Suryakanta Nayak
- 申请人: NATIONAL UNIVERSITY OF SINGAPORE
- 申请人地址: SG Singapore
- 专利权人: NATIONAL UNIVERSITY OF SINGAPORE
- 当前专利权人: NATIONAL UNIVERSITY OF SINGAPORE
- 当前专利权人地址: SG Singapore
- 代理机构: Volpe Koenig
- 优先权: SG10201803574Y 20180427
- 国际申请: PCT/SG2019/050227 WO 20190424
- 国际公布: WO2019/209180 WO 20191031
- 主分类号: G01N27/24
- IPC分类号: G01N27/24 ; B65B57/10
摘要:
A method and system for integrity testing of sachets. The method comprises the steps of disposing at least a portion of the sachet relative to an electrode structure; applying an AC bias voltage to the electrode structure; measuring an electrical property of the portion of the sachet over a frequency range, and determining the integrity based on the measured electrical property over the frequency range.
公开/授权文献
- US20210372961A1 METHOD AND SYSTEM FOR INTEGRITY TESTING OF SACHETS 公开/授权日:2021-12-02
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