- 专利标题: Systems and methods to assess and repair data using data quality indicators
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申请号: US16999196申请日: 2020-08-21
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公开(公告)号: US11531669B2公开(公告)日: 2022-12-20
- 发明人: Donal O'Farrell , Zhen Song , Megan McHugh , Alexander Guiterrez
- 申请人: Siemens Industry, Inc.
- 申请人地址: US GA Alpharetta
- 专利权人: Siemens Industry, Inc.
- 当前专利权人: Siemens Industry, Inc.
- 当前专利权人地址: US GA Alpharetta
- 主分类号: G06F16/23
- IPC分类号: G06F16/23 ; G05B19/042
摘要:
Methods for data quality analysis and aggregation in a building automation system and corresponding systems and computer-readable mediums. A method includes receiving input data and receiving a configuration file that defines data quality (DQ) processes to be performed on the input data. The method includes dynamically building a configurable pipeline based on the configuration file, the pipeline including one or more Data Quality Indicator (DQI) or Data Quality Aggregation (DQA) process components from a DQ core library. The method includes performing DQ processes on the input data, including executing each of the DQI or DQA process components included in the pipeline, producing one or more DQ results based on the DQ processes, and returning the one or more DQ results.
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