- 专利标题: Abnormality determination device and abnormality determination system
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申请号: US16925341申请日: 2020-07-10
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公开(公告)号: US11531327B2公开(公告)日: 2022-12-20
- 发明人: Keita Hada
- 申请人: FANUC Corporation
- 申请人地址: JP Yamanashi
- 专利权人: FANUC Corporation
- 当前专利权人: FANUC Corporation
- 当前专利权人地址: JP Yamanashi
- 代理机构: Hauptman Ham, LLP
- 优先权: JPJP2019-131452 20190716
- 主分类号: G05B23/02
- IPC分类号: G05B23/02 ; G06N20/00
摘要:
An abnormality determination device acquires observation data observed during an operation of an industrial machine, extracts partial time-series data, including a portion representative of a feature of an operating state at a specified timing, from the observation data, calculates a statistical amount from the extracted partial time-series data, and performs processing for machine learning related to determination of operation abnormality of the industrial machine, based on the calculated statistical amount.
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