An automated test equipment for testing one or more devices under test comprising a plurality of port processing units, comprising at least a respective buffer memory, and a respective high-speed-input-output, HSIO, interface for connecting with at least one of the devices under test. The port processing units are configured to receive data, store the received data in the respective buffer memory, and provide the data stored in the respective buffer memory to one or more of the connected devices under test via the respective HSIO interface for testing the one or more connected devices under test. A method and computer program for automated testing of one or more devices under test are also described.