- 专利标题: System and methods for contour stitching in additive manufacturing systems
-
申请号: US16722517申请日: 2019-12-20
-
公开(公告)号: US11407170B2公开(公告)日: 2022-08-09
- 发明人: Brian Scott McCarthy , John Joseph Madelone, Jr. , Justin John Gambone, Jr. , Rachel Wyn Levine
- 申请人: General Electric Company
- 申请人地址: US NY Schenectady
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: US NY Schenectady
- 代理机构: Dority & Manning, P.A.
- 主分类号: B29C64/393
- IPC分类号: B29C64/393 ; B29C64/153 ; B29C64/282 ; B29C64/245 ; B29C64/255 ; B29C64/268 ; B33Y10/00 ; B33Y30/00
摘要:
An additive manufacturing system includes a first laser device configured to generate a first laser beam and a second laser device configured to generate a second laser beam. The laser scanning devices include a first laser scanning device and a second laser scanning device. The first laser scanning device is configured to selectively direct the first laser beam from the first laser devices across a powder bed along a plurality of first hatching paths and a first contour path along a contour of the solid component. The second laser scanning device is configured to selectively direct the second laser beam from the second laser devices across the powder bed along a plurality of second hatching paths and a second contour path along the contour of the solid component. The first contour path includes a first hook extending into the plurality of second hatching paths.
公开/授权文献
信息查询