- 专利标题: Sample measurement device and sample measurement method
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申请号: US16786200申请日: 2020-02-10
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公开(公告)号: US11333605B2公开(公告)日: 2022-05-17
- 发明人: Kazuhiro Sasaki , Takeshi Yamamoto
- 申请人: SYSMEX CORPORATION
- 申请人地址: JP Kobe
- 专利权人: SYSMEX CORPORATION
- 当前专利权人: SYSMEX CORPORATION
- 当前专利权人地址: JP Kobe
- 代理机构: Crowell & Moring LLP
- 优先权: JPJP2019-031055 20190222
- 主分类号: G01N21/64
- IPC分类号: G01N21/64 ; G01N15/14
摘要:
Disclosed is a sample measurement device including a light applicator configured to apply a light to a sample so as to generate light from a particle in the sample; an optical block in which a plurality of prisms are fixed, each of the plurality of prisms including a light entry surface which allows entry thereinto of the light generated from the particle in the sample, a reflection surface configured to selectively reflect a part of the light having entered the light entry surface, and a light outputting surface configured to output the light reflected by the reflection surface; and a light receiver configured to receive the light outputted from the light outputting surface of each of the plurality of prisms.
公开/授权文献
- US20200271585A1 SAMPLE MEASUREMENT DEVICE AND SAMPLE MEASUREMENT METHOD 公开/授权日:2020-08-27
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