Sample measurement device and sample measurement method
摘要:
Disclosed is a sample measurement device including a light applicator configured to apply a light to a sample so as to generate light from a particle in the sample; an optical block in which a plurality of prisms are fixed, each of the plurality of prisms including a light entry surface which allows entry thereinto of the light generated from the particle in the sample, a reflection surface configured to selectively reflect a part of the light having entered the light entry surface, and a light outputting surface configured to output the light reflected by the reflection surface; and a light receiver configured to receive the light outputted from the light outputting surface of each of the plurality of prisms.
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