• 专利标题: Configuration tool and method for a quality control system
  • 申请号: US16650536
    申请日: 2018-02-13
  • 公开(公告)号: US11244507B2
    公开(公告)日: 2022-02-08
  • 发明人: Ives De Saeger
  • 申请人: ARKITE NV
  • 申请人地址: BE Genk
  • 专利权人: ARKITE NV
  • 当前专利权人: ARKITE NV
  • 当前专利权人地址: BE Genk
  • 代理机构: Workman Nydegger
  • 优先权: EP17193384 20170927
  • 国际申请: PCT/EP2018/053513 WO 20180213
  • 国际公布: WO2019/063133 WO 20190404
  • 主分类号: G06T19/00
  • IPC分类号: G06T19/00 G01F15/075 G06F3/01 G06T15/08
Configuration tool and method for a quality control system
摘要:
A configuration tool adapted to configure a quality control system to monitor and/or guide an operator in a working environment through recognition of objects, events or an operational process, comprises: a volumetric sensor adapted to capture volumetric image frames of the working environment while an object, event or operational process is demonstrated; a display, coupled to the volumetric sensor and configured to live display the volumetric image frames; and a processor configured to: generate a user interface in overlay of the volumetric image frames to enable a user to define a layout zone; and automatically generate a virtual box in the layout zone when an object, event or operational process is detected during demonstration of the object, event or operational process.
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