Invention Grant
- Patent Title: Generating structured metrics from log data
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Application No.: US16264335Application Date: 2019-01-31
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Publication No.: US11238057B2Publication Date: 2022-02-01
- Inventor: Amrittpal Singh Bath , Pratiksha Shah , Murugan Kandaswamy , Vishal Patel
- Applicant: Splunk Inc.
- Applicant Address: US CA San Francisco
- Assignee: Splunk Inc.
- Current Assignee: Splunk Inc.
- Current Assignee Address: US CA San Francisco
- Agency: Perkins Coie LLP
- Main IPC: G06F16/00
- IPC: G06F16/00 ; G06F16/248 ; G06F16/22 ; G06F16/25 ; G06F16/28 ; G06F16/901 ; G06F16/951 ; G06F16/242 ; G06F16/2455 ; G06F16/2458 ; G06F16/835 ; G06F16/9038 ; G06F16/9535 ; G06F16/903 ; H04L29/08 ; G06F3/0481 ; G06T11/20 ; H04L12/26

Abstract:
The disclosed technique can be performed by a data intake and query system. The technique includes ingesting data including log data obtained over a network from systems, and receiving user input indicating a scope for retrieving data and a criterion expressed in a structured language. The technique further includes retrieving data based on the scope indicated by the user input and extracting a first field value and a second field value from the retrieved data based on the criterion and the scope. The first field value includes a first numerical value indicative of a measured characteristic of a computing device and the second field value includes a first dimension. The technique further includes storing a first structured metric and the first dimension in a time-series metrics store. The first structured metric includes the first numerical value. The first dimension is associated with the first numerical value.
Public/Granted literature
- US20190163678A1 GENERATING STRUCTURED METRICS FROM LOG DATA Public/Granted day:2019-05-30
Information query