Invention Grant
- Patent Title: Display device and inspecting method therefor
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Application No.: US15987268Application Date: 2018-05-23
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Publication No.: US11195440B2Publication Date: 2021-12-07
- Inventor: Kwang Sae Lee , Jung Hoon Shim , Won Kyu Kwak , Ki Myeong Eom
- Applicant: SAMSUNG DISPLAY CO., LTD.
- Applicant Address: KR Yongin-si
- Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee Address: KR Yongin-si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2017-0063587 20170523
- Main IPC: G09G3/00
- IPC: G09G3/00 ; G01R27/08 ; G01R31/28

Abstract:
A display device includes a defect inspection circuit, and a display panel having a display area and a peripheral area positioned outside the display area. The display panel includes a sensing wire positioned in the peripheral area and connected to the defect inspection circuit. The defect inspection circuit includes a resistance detection circuit that detects a resistance of the sensing wire based on an output signal corresponding to the sensing wire, a memory that stores first resistance information related to the resistance of the sensing wire detected in a first inspection operation, and a comparator circuit including a first comparator that compares the first resistance information with second resistance information. The second resistance information is related to the resistance of the sensing wire detected in a second inspection operation that is performed at a different time than the first inspection operation.
Public/Granted literature
- US20180342185A1 DISPLAY DEVICE AND INSPECTING METHOD THEREFOR Public/Granted day:2018-11-29
Information query