- 专利标题： Method for analyzing samples and device for analyzing samples
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申请号： US16340055申请日： 2017-10-04
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公开(公告)号： US11169071B2公开(公告)日： 2021-11-09
- 发明人: Hirotoshi Yasaki , Takao Yasui , Noritada Kaji , Yoshinobu Baba , Tomoji Kawai , Satoyuki Kawano , Kentaro Doi , Takeshi Yanagida , Mao Fukuyama
- 申请人： National University Corporation Nagoya University , OSAKA UNIVERSITY , KYUSHU UNIVERSITY, NATIONAL UNIVERSITY CORPORATION
- 申请人地址： JP Aichi; JP Osaka; JP Fukuoka
- 专利权人： National University Corporation Nagoya University,OSAKA UNIVERSITY,KYUSHU UNIVERSITY, NATIONAL UNIVERSITY CORPORATION
- 当前专利权人： National University Corporation Nagoya University,OSAKA UNIVERSITY,KYUSHU UNIVERSITY, NATIONAL UNIVERSITY CORPORATION
- 当前专利权人地址： JP Aichi; JP Osaka; JP Fukuoka
- 代理机构： McDermott Will & Emery LLP
- 优先权： JPJP2016-199331 20161007
- 国际申请： PCT/JP2017/036124 WO 20171004
- 国际公布： WO2018/066597 WO 20180412
- 主分类号： G01N15/00
- IPC分类号： G01N15/00 ; G01N27/447 ; G01N15/10 ; G01N27/327
摘要：
In a method for analyzing samples involving the use of a device for analyzing samples, the device for analyzing samples includes at least a movement part through which a sample moves, and a measurement unit that is formed in a middle of the movement part and that measures a value of an ion current when the sample passes through the movement part. The analysis method includes at least a measurement step for measuring the value of the ion current when the sample passes through the movement part, and a determination step for determining a change over time in a quantity of ions from the value of the ion current measured in the measurement step. The quantity of ions includes a quantity of ions that have leaked from the sample during movement of the sample through the movement part.
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